News & Events

NiT Alpha II Series

Friday, February 25th, 2011

The NiT Alpha II series is a 16-heads turret based test handler developed to handle very small integrated circuit devices using the flexibility of vibrating bowl with short test time and high speed indexing.

This High Speed Test Handler has the flexibility of configuring multiple process capabilities to meet today’s demanding environment of high productivity semiconductor manufacturing on Test, Laser Marking, Vision Inspections and Packing.

Some of its handling capabilities include individual motor & linear up down pusher, multiple test sites, vision inspections, part orientation, and laser marking, rejects sorting in bucket, and tape & reel modules. It also provides an easy conversion to various semiconductor


NiT P1 Series

Friday, February 25th, 2011

NiT P1 SERIES

NiT P1 series is a 24-heads turret based test handler developed to handle SIP circuit devices using the flexibility of vibrating bowl or tube stacker.

This high speed test handler has the flexibility of configuring multiple process capabilities to meet today’s demanding environment of high productivity semiconductor manufacturing on test, laser marking, vision inspections and packing. 

Some of its handling capabilities include multiple test sites, vision inspections, part orientation, laser marking, reject sorting in tube stacker or bucket, and taping. It also provides easy conversion to various semiconductor packages.


NiT X3 Series

Friday, August 27th, 2010

The NiT X3 series is a 16-heads turret based test handler developed to handle small integrated circuit devices using the flexibility of vibrating bowl feeder or tube stacker.

This High Speed Test Handler has the flexibility of configuring multiple process capabilities to meet today’s demanding environment of high productivity semiconductor manufacturing on Test and Vision Inspection.

Some of its handling capabilities include multiple test sites, vision inspections, part orientation, laser marking, reject sorting in bucket or tube stacker. It also provides an easy conversion to various semiconductor packages.


NiT ALPHA S Series

Tuesday, December 29th, 2009

The NiT Alpha S series is a turret based test handler developed to handle small integrated circuit devices using the flexibility of vibrating bowl feeder or tube stacker.

This High Speed Test Handler has the flexibility of configuring multiple process capabilities to meet today’s demanding environment of high productivity semiconductor manufacturing on Test and Vision Inspection.

Some of its handling capabilities include multiple test sites, vision inspections, part orientation, laser marking, reject sorting and double tape and reel modules. It also provides an easy conversion to various semiconductor packages.


TURRET CHIP SORTER (TCS)

Tuesday, December 29th, 2009

The TCS series is a turret based Chip Sorter developed to handle QFN devices using the Wafer Ring or Bowl feeding.

This High Speed Chip Sorter has the flexibility of configuring multiple process capabilities to meet today’s demanding environment of high productivity semiconductor manufacturing on Test ,Vision Inspections, Laser Marking and Packing.

Some of its handling capabilities include Flipper, dual test, special vision inspections, part orientation, reject sorting, stacker tube OR tape and reel output. It also provides an easy conversion to various process like re-test which feeding from bowl OR use like a stand alone turret handler which bypass the wafer ring portion.